Observation of the strain field near the Si(111) 7 × 7 surface with a new X-ray diffraction technique

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 964-966

  Emoto, Takashi ^a   Akimoto, Koichi ^a   Ichimiya, Ayahiko ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Asymmetric Bragg case; Dynamical theory; Si(111) 7 7; Strain field; X ray diffraction

Indexed keywords

EID: 0032360785     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597017792     Document Type: Article

References (6)

1. Chikawa, J., Asaeda, Y. & Fujimoto, I. (1970). J. Appl. Phys. 41, 1922-1925.
2. Hasegawa, E., Ishitani, A., Akimoto, K., Tsukiji, M. & Ohta, N. (1995). J. Electrochem. Soc. 142, 273-282.
3. Kelires, P. C. & Tersoff, J. (1989). Phys. Rev. Lett. 63, 1164-1167.
4. Kishino, S. & Kohra, K. (1971). Jpn J. Appl. Phys. 10, 551-557.
5. Kitano, T., Kimura, S. & Ishikawa, T. (1992). Appl. Phys. Lett. 60, 177-179.
6. Williams, A. A., Thornton, J. M. C., Macdonald J. E., van Silfhout, R. G., van der Veen, J. F., Finney, M. S., Johnson, A. D. & Norris, C. (1991). Phys. Rev. B, 43, 5001-5011.