A SOM-FBPN-ensemble approach with error feedback to adjust classification for wafer-lot completion time prediction

International Journal of Advanced Manufacturing Technology

Volumn 37, Issue 7-8, 2008, Pages 782-792

  Chen, Toly ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Completion time prediction; Ensemble; Error feedback; Fuzzy back propagation network; Self organization map; Wafer fab

Indexed keywords

BACKPROPAGATION; ERROR ANALYSIS; PRODUCTION; SELF ORGANIZING MAPS; WAFER BONDING;

COMPLETION TIME PREDICTION; ERROR FEEDBACK; FUZZY BACK PROPAGATION NETWORKS; WAFER FAB;

FUZZY NEURAL NETWORKS;

EID: 42649085767     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-007-1007-y     Document Type: Article

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