A hybrid look-ahead SOM-FBPN and FIR system for wafer-lot-output time prediction and achievability evaluation

International Journal of Advanced Manufacturing Technology

Volumn 35, Issue 5-6, 2007, Pages 575-586

  Chen, Toly ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Achievability; Fuzzy back propagation network; Fuzzy inference rules; Output time prediction; Self organization map; Wafer fab

Indexed keywords

BACKPROPAGATION; COMPUTER AIDED MANUFACTURING; FUZZY INFERENCE; SELF ORGANIZING MAPS;

FUZZY BACK PROPAGATION NETWORKS; FUZZY INFERENCE RULES; OUTPUT TIME PREDICTION; WAFER FABS;

FUZZY NEURAL NETWORKS;

EID: 36049051023     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-006-0741-x     Document Type: Article

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