An intelligent hybrid system for wafer lot output time prediction

Advanced Engineering Informatics

Volumn 21, Issue 1, 2007, Pages 55-65

  Chen, Toly ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Future release plan; Fuzzy back propagation network; Hybrid system; k Means; Output time prediction; Wafer fab

Indexed keywords

FUZZY SETS; INVENTORY CONTROL; NEURAL NETWORKS; SEMICONDUCTOR DEVICE MANUFACTURE;

FUTURE RELEASE PLAN; FUZZY BACK PROPAGATION NETWORK; HYBRID SYSTEMS; K-MEANS; OUTPUT TIME PREDICTION; WAFER FAB;

PRODUCTION ENGINEERING;

EID: 33846817362     PISSN: 14740346     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aei.2006.10.002     Document Type: Article

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