Controlled manipulation of carbon nanopillars and cantilevers by focused ion beam

Nanotechnology

Volumn 19, Issue 20, 2008, Pages

  Tripathi, Sarvesh K ^a   Shukla, Neeraj ^a   Dhamodaran, S ^a   Kulkarni, Vishwas N ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; FOCUSED ION BEAMS; GRADIENT INDEX OPTICS; PIECEWISE LINEAR TECHNIQUES; SCANNING;

CANTILEVER STRUCTURES; CARBON NANOPILLARS; NANOSIZE MECHANICAL COMPONENTS;

NANOSTRUCTURES;

CARBON; NANOMATERIAL;

ARTICLE; BENDING; CANTILEVER; CHEMICAL VAPOR DEPOSITION; ELECTRON BEAM; FOCUSED ION BEAM; HEATING; HIGH TEMPERATURE; PRIORITY JOURNAL; STRUCTURE ANALYSIS; TECHNIQUE; TEMPERATURE; TEMPERATURE SENSITIVITY;

EID: 42449156802     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/20/205302     Document Type: Article

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