Unraveling the oxidation of Ru using XPS

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 334-337

  Ernst, M A ^a   Sloof, W G ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Oxidation; Peak fitting; Ruthenium; X ray photoelectron spectroscopy

Indexed keywords

OXIDATION; OXIDES; SINGLE CRYSTALS; X RAY PHOTOELECTRON SPECTROSCOPY;

METAL SUBSTRATES; OXIDIC ELECTRONS; PEAK FITTING;

RUTHENIUM COMPOUNDS;

EID: 42449142943     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2675     Document Type: Conference Paper

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