Modeling of complex surface structures for ARXPS

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 700-705

  Oswald, S ^a   Oswald, F ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Angle resolved XPS; Model calculations; Simulation; Surface roughness; X ray photoelectron spectroscopy

Indexed keywords

COMPUTER SIMULATION; ELASTIC SCATTERING; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED XPS; MODEL CALCULATIONS;

SURFACE ANALYSIS;

EID: 42449106641     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2756     Document Type: Conference Paper

References (22)

1. Cumpson PJ. J. Electron Spectrosc. Relat. Phenom. 1995; 73: 25.
2. Oswald S, Zier M, Reiche R, Wetzig K. Surf. Interface Anal. 2006; 38: 590.
3. Cumpson PJ. ArCtic ARXPS-Spreadsheet, Crown Copyright 1998, Version 1.0. http://www.npl.co.uk., 1998.
4. Paynter RW. Surf. Interface Anal. 1999; 27:103.
5. Kozlowska M, Reiche R,Oswald S, Vinzelberg H, Hübner R, Wetzig K. Surf. Interface Anal. 2004; 36:1600.
6. Oswald S, Oswald F. J. Appl. Phys. 2006; 100: 104504.
7. Oswald S. Surf. Sci. 2008; 602:291 doi: 10.1016/j.susc.2007.10.015.
8. Cumpson PJ, Seah MP. Surf. Interface Anal. 1997; 25:430.
9. Ebel H, Ebel MF, Hillbrand E. J. Electron Spectrosc. Relat. Phenom. 1973; 2:277.
10. Fadley CS, Baird RJ, SiekhausW, Novakov T, Bergström SAL. J. Electron Spectrosc. Relat. Phenom. 1974; 4: 93.
11. Shimizu R, Ze-Jun D. Rep. Prog. Phys. 1992; 55:487.
12. Chen YF. Surf. Sci. 1997; 380:199.
13. Jablonski A, Powell G. NIST Electron Elastic-scattering Cross-section Database. NIST: Gaithersburg, 2000.
14. Powell CJ, Jablonski A. NIST Electron Inelastic-Mean-Free-Path Database. NIST: Gaithersburg, 2000.
15. Chen YF. Surf. Sci. 1996; 345:213.
16. Werner WSM, Eisenmenger-Sittner C, Zemek J, Jiricek P. Phys. Rev. B 2003;67:155412.
17. Werner WSM. Surf. Interface Anal. 1995; 23:696.
18. Gunter PLJ, Gijzeman OLJ, Niemantsverdriet JW. Appl.Surf.Sci. 1997; 115:342.
19. Zalm PC. Surf. Interface Anal. 1998; 26:352.
20. Olejnik K, Zemek J, Werner WSM. Surf. Sci. 2005; 595:212.
21. Kappen P, Reihs K, Seidel C, Voetz M, Fuchs H. Surf. Sci. 2000; 465: 40.
22. Olejnik K, Zemek J, Werner WSM. ECASIA 07, Book of Abstracts. Brussels, 2007; 223.