Theoretical evaluation of the frequency shift and dissipated power in noncontact Atomic Force Microscopy

Applied Physics A: Materials Science and Processing

Volumn 72, Issue 7, 2001, Pages

  Sasaki, N ^a,b   Tsukada, M ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4244023535     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390100632     Document Type: Article

References (13)

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