Radiation hardness performance of ATLAS pixel tracker

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 530, Issue 1-2, 2004, Pages 65-70

  Troncon, Clara ^a  

^a UNIVERSITY OF MILAN   (Italy)

Author keywords

Charge collection; Charge trapping; DOFZ silicon; Radiation damage

Indexed keywords

ANNEALING; ELECTRON TRAPS; INTERPOLATION; IRRADIATION; RADIATION DAMAGE; RADIATION HARDENING; SILICON SENSORS;

CHARGE COLLECTION; CHARGE TRAPPING; DOFZ SILICON; PIXEL TRACKERS;

PARTICLE BEAM TRACKING;

EID: 4243069399     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.05.049     Document Type: Conference Paper

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