Charge collection and charge sharing in heavily irradiated n-side read-out silicon microstrip detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 511, Issue 1-2, 2003, Pages 112-117

  Casse, G ^a   Allport, P P ^a   Biagi, S F ^a   Bowcock, T J V ^a   Greenall, A ^a   Turner, P R ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Charge collection; Radiation hardness; Silicon microstrip detectors

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC SPACE CHARGE; OXYGEN; RADIATION DAMAGE; SEMICONDUCTOR JUNCTIONS; SILICON WAFERS;

MICROSTRIP DETECTORS;

PARTICLE DETECTORS;

EID: 0041386483     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(03)01774-1     Document Type: Conference Paper

References (10)

1. Bauer C.et al. Nucl. Instr. and Meth. A. 485:2002;116.
2. Lindström G.et al. Nucl. Instr. and Meth. A. 465:2000;60.
3. Casse G.et al. Nucl. Instr. and Meth. A. 466:2001;335.
4. M. Glaser, et al., Nucl. Instr. and Meth. A 426 (1999) 72. (See also http://irradiation.web.cern.ch/irradiation/.).
5. Bowcock T.J.V. Nucl. Instr. and Meth. A. 435:1999;65.
6. LHCb Vertex Locator TDR, CERN/LHCC/2001-011.
7. E. Leòn-Floriàn, et al., CERN-ECP/95-15.
8. Kaplon J.et al. IEEE Trans. Nucl. Sci. NS-44:1997;298.
9. Marti S., Garcia I., Allport P.P., Casse G., Greenall A. Nucl. Instr. and Meth. A. 473:2001;128.
10. ISE TCAD 7.5, Integrated System Engineering, http://www.ise.ch/.