Electrical characteristics of silicon pixel detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 489, Issue 1-3, 2002, Pages 202-217

  Gorelov, I ^a   Gorfine, G ^a   Hoeferkamp, M ^a   Mata Bruni, V ^a   Santistevan, G ^a   Seidel, S C ^a   Ciocio, A ^b   Einsweiler, K ^b   Emes, J ^b   Gilchriese, M ^b   Joshi, A ^b   Kleinfelder, S ^b   Marchesini, R ^b   McCormack, F ^b   Milgrome, O ^b   Palaio, N ^b   Pengg, F ^b   Richardson, J ^b   Zizka, G ^b   Ackers, M ^c   Comes, G ^c   Fischer, P ^c   Keil, M ^c   Martinez, G ^c   Peric, I ^c   Runolfsson, O ^c   Stockmanns, T ^c   Treis, J ^c   Wermes, N ^c   Gossling C ^d   Hugging F ^d   Klaiber Lodewigs, J ^d   Krasel, O ^d   Wustenfeld J ^d   Wunstorf, R ^d   Barberis, D ^e   Beccherle, R ^e   Caso, C ^e   Cervetto, M ^e   Darbo, G ^e   Gagliardi, G ^e   Gemme, C ^e   Morettini, P ^e   Netchaeva, P ^e   Osculati, B ^e   Rossi, L ^e   Charles, E ^f   Fasching, D ^f   Blanquart, L ^g   Breugnon, P ^g   Calvet, D ^g   Clemens, J C ^g   Delpierre, P ^g   Hallewell, G ^g   Laugier, D ^g   Mouthuy, T ^g   Rozanov, A ^g   Valin, I ^g   Andreazza, A ^h   Caccia, M ^h   Citterio, M ^h   Lari, T ^h   Meroni, C ^h   Ragusa, F ^h   Troncon, C ^h   Vegni, G ^h   Lutz, G ⁱ   Richter, R H ⁱ   Rohe, T ⁱ   Boyd, G R ^j   Skubic, P L ^j   Sicho P ^k   Tomasek, L ^k   Vrba, V ^k   Holder, M ^l   Ziolkowski, M ^l   Cauz, D ^m   Cobal Grassmann, M ^m   D'Auria, S ^m   De Lotto, B ^m   Del Papa, C ^m   Grassmann, H ^m   Santi, L ^m   Becks, K H ⁿ   Lenzen, G ⁿ   Linder, C ⁿ   more..

^a UNIVERSITY OF NEW MEXICO   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF BONN   (Germany)

^d TU DORTMUND UNIVERSITY   (Germany)

^e INFN SEZIONE DI GENOVA   (Italy)

^f University of Wisconsin Madison   (United States)

^g AIX MARSEILLE UNIVERSITÉ   (France)

^h INFN SEZIONE DI MILANO   (Italy)

ⁱ MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^j UNIVERSITY OF OKLAHOMA   (United States)

^k INSTITUTE OF PHYSICS   (Czech Republic)

^l UNIVERSITY OF SIEGEN   (Germany)

^m Dipartimento di Fisica   (Italy)

ⁿ UNIVERSITY OF WUPPERTAL   (Germany)

more..

Author keywords

Pixel; Semiconductor; Silicon; Tracking

Indexed keywords

CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; SEMICONDUCTOR MATERIALS; SILICON WAFERS;

SILICON PIXEL DETECTORS;

PARTICLE DETECTORS;

EID: 0037151459     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)00557-0     Document Type: Article

References (7)