Performance measurements of Al/CdTe/Pt pixel diode detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6706, Issue , 2007, Pages

  Ishikawa, Shin Nosuke ^a,b   Aono, Hiroyuki ^a,b   Watanabe, Shin ^a   Takeda, Shin'ichiro ^a,b   Nakazawa, Kazuhiro ^b   Takahashi, Tadayuki ^a,b  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Cadmium telluride(CdTe); Gamma ray detector; Gamma ray spectroscopy; Hard X ray detector; Schottky CdTe

Indexed keywords

BIAS VOLTAGE; ELECTRODES; GAMMA RAY SPECTROMETERS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING CADMIUM TELLURIDE;

CADMIUM TELLURIDE(CDTE); GAMMA-RAY DETECTOR; HARD X-RAY DETECTOR; SCHOTTKY CDTE;

PARTICLE DETECTORS;

EID: 42149190007     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.735188     Document Type: Conference Paper

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