Performance of a new Schottky CdTe detector for hard x-ray spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3446, Issue , 1998, Pages 29-39

  Takahashi, T ^a   Hirose, K ^a   Matsumoto, C ^a   Takizawa, K ^a   Ohno, R ^a   Ozaki, T ^a   Mori, K ^a   Tomita, Y ^a  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

CdTe; CdZnTe; Gamma ray detector; Gamma ray spectrometry; Hard X ray detector; Schottky CdTe

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; ELECTRODES; GAMMA RAY SPECTROMETERS; LEAKAGE CURRENTS; PERFORMANCE; RADIATION DETECTORS; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; THERMOELECTRICITY; X RAY SPECTROSCOPY;

BIAS VOLTAGE; CADMIUM TELLURIDE; ENERGY RESOLUTION; GAMMA RAY DETECTOR;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032404455     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.312900     Document Type: Conference Paper

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