Organic phototranistor behavior and light-accelerated bias stress

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6658, Issue , 2007, Pages

  Debucquoy, Maarten ^a,b   Verlaak, Stijn ^a   Stoedel, Soeren ^a,b   Myny, Kris ^a   Genoe, Jan ^a   Heremans, Paul ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Bias stress; Organic; Phototransistor; Transistor

Indexed keywords

ELECTRIC POTENTIAL; INTERFACES (MATERIALS); SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DEVICES; SENSITIVITY ANALYSIS;

BIAS STRESS; ORGANIC SEMICONDUCTOR INTERFACE; ORGANIC TRANSISTORS;

PHOTOTRANSISTORS;

EID: 42149185576     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.734157     Document Type: Conference Paper

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