SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 108, Issue 6, 2008, Pages 567-578

Multivariate statistical approach to electron backscattered diffraction

(3) Brewer, Luke N a Kotula, Paul G a Michael, Joseph R a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

Data processing image processing; Electron backscatter diffraction; Electron diffraction

Indexed keywords

BACKSCATTERING; DATA PROCESSING; IMAGE PROCESSING; MICROSTRUCTURE; STATISTICAL METHODS;

MULTIVARIATE STATISTICAL ANALYSIS (MSA); SPATIAL RESOLUTION;

ELECTRON DIFFRACTION;

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; IMAGE ANALYSIS; LIGHT SCATTERING; MULTIVARIATE ANALYSIS; SCANNING ELECTRON MICROSCOPY; STATISTICAL ANALYSIS; STRUCTURE ANALYSIS;

EID: 41949119849 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2007.10.013 Document Type: Article

Times cited : (21)

References (16)

1
- 0003594630
- Kluwer Academic, New York
- Schwartz A.J., et al. Electron Backscatter Diffraction in Materials Science (2000), Kluwer Academic, New York
- (2000) Electron Backscatter Diffraction in Materials Science
- Schwartz, A.J.¹

2
- 0031171333
- Isabell T.C., et al. Ultramicroscopy 67 1/4 (1997) 59
- (1997) Ultramicroscopy , vol.67 , Issue.1-4 , pp. 59
- Isabell, T.C.¹

3
- 0036094498
- Small J.A., et al. J. Microsc. 206 (2002) 170
- (2002) J. Microsc. , vol.206 , pp. 170
- Small, J.A.¹

4
- 18444385680
- Sivel V.G.M., et al. J. Microsc., Oxford 218 (2005) 115
- (2005) J. Microsc., Oxford , vol.218 , pp. 115
- Sivel, V.G.M.¹

5
- 0037326065
- Kotula P.G., et al. Microsc. Microanal. 9 1 (2003) 1
- (2003) Microsc. Microanal. , vol.9 , Issue.1 , pp. 1
- Kotula, P.G.¹

6
- 41949139402
- Kotula P.G., et al. Geochim. Cosmochim. Acta 69 10 (2005) A588
- (2005) Geochim. Cosmochim. Acta , vol.69 , Issue.10
- Kotula, P.G.¹

7
- 4444247559
- Peebles D.E., et al. J. Vac. Sci. Technol. A 2 4 (2004) 1579
- (2004) J. Vac. Sci. Technol. A , vol.2 , Issue.4 , pp. 1579
- Peebles, D.E.¹

8
- 1842714914
- Keenan M.R., et al. Surface Interface Anal. 36 3 (2004) 203
- (2004) Surface Interface Anal. , vol.36 , Issue.3 , pp. 203
- Keenan, M.R.¹

9
- 4544338953
- M.R. Keenan, et al., Multivariate statistical analysis of EELS-spectral images, in: Microscopy and Microanalysis, Savannah, GA, 2004.
- M.R. Keenan, et al., Multivariate statistical analysis of EELS-spectral images, in: Microscopy and Microanalysis, Savannah, GA, 2004.

10
- 0004091959
- Wiley, New York
- Malinowski E.R. Factor Analysis in Chemistry. second ed. (1991), Wiley, New York
- (1991) Factor Analysis in Chemistry. second ed.
- Malinowski, E.R.¹

11
- 0033166737
- Bonnet N., et al. Ultramicroscopy 77 (1999) 97
- (1999) Ultramicroscopy , vol.77 , pp. 97
- Bonnet, N.¹

12
- 0035946878
- Wilkinson A.J. Scripta Mater. 44 (2001) 2379
- (2001) Scripta Mater. , vol.44 , pp. 2379
- Wilkinson, A.J.¹

13
- 33344475405
- Wilkinson A.J., et al. Ultramicroscopy 106 (2006) 307
- (2006) Ultramicroscopy , vol.106 , pp. 307
- Wilkinson, A.J.¹

14
- 41949131056
- P.G. Kotula, Private communication, 2007.
- P.G. Kotula, Private communication, 2007.

15
- 41949121237
- Pierre and Marie Curie University, Paris, France p. 81
- Fragneau M. Study of the Interfacial Structure and Its Influence on the Properties of Composite Materials (Oriented Eutectics) Based upon Nickel Oxide (1983), Pierre and Marie Curie University, Paris, France p. 81
- (1983) Study of the Interfacial Structure and Its Influence on the Properties of Composite Materials (Oriented Eutectics) Based upon Nickel Oxide
- Fragneau, M.¹

16
- 23844471331
- D.P. Field, Improving the spatial resolution of EBSD, in: Microscopy and Microanalysis, Cambridge University Press, Honolulu, HI, 2005.
- D.P. Field, Improving the spatial resolution of EBSD, in: Microscopy and Microanalysis, Cambridge University Press, Honolulu, HI, 2005.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.