Molecular dynamics study of size effects and deformation of thin films due to nanoindentation

CMES - Computer Modeling in Engineering and Sciences

Volumn 24, Issue 2-3, 2008, Pages 239-248

  Nair, Arun K ^a   Farkas, Diana ^a   Kriz, Ronald D ^a  

^a Virginia Polytechnic Institute and State University   (United States)

Author keywords

Embedded atom method; Indentation; Molecular dynamics; Nickel; Thin films

Indexed keywords

EMBEDDED ATOM METHODS; INTERATOMIC POTENTIALS; SINGLE CRYSTAL FILMS;

COMPUTER SIMULATION; FILM THICKNESS; NANOINDENTATION; NICKEL; THIN FILMS;

MOLECULAR DYNAMICS;

EID: 41649110472     PISSN: 15261492     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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