Effects of thickness and indenter geometry in nanoindentation of nickel thin films

Materials Research Society Symposium - Proceedings

Volumn 795, Issue , 2003, Pages 355-360

  Parakala, Padma ^a   Mirshams, Reza A ^a   Nasrazadani, Seifollah ^a   Lian, Kun ^b  

^a UNIVERSITY OF NORTH TEXAS   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; DEFORMATION; DISLOCATIONS (CRYSTALS); ELASTIC MODULI; FRACTURE TOUGHNESS; GRAIN SIZE AND SHAPE; HARDNESS; INDENTATION; NICKEL COMPOUNDS; SILICON CARBIDE; STRENGTH OF MATERIALS; STRUCTURAL LOADS; TRANSMISSION ELECTRON MICROSCOPY;

AREA COEFFICIENTS; CONTINUOUS STIFFNESS MODES (CSM); INDENTATION SIZE EFFECT (ISE); NANOINDENDATION;

THIN FILMS;

EID: 2442499391     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-795-u11.19     Document Type: Conference Paper

References (21)

1. X. Li and B. Bhushan, Materials Characterization 48, 11(2002).
2. G.M. Pharr, Materials Science and Engineering A 253, 151(1998).
3. G. M. Pharr, W. C. Oliver, and F. R. Brotzen, J. Mater. Res. 7, 613 (1992)
4. C. Fischer-Cripps, Nanoindentation (New York, Springer, 2002) p.1-9.
5. X. Lia, B. Bhushana, K. Takashimab, C-W Baekc, Y-K Kimc, Ultramicroscopy 97, 481-494, (2003).
6. Tai-Ran Hsu, MEMS and Microsystems Design and Manufacture, (McGraw Hill, 2002) p. 235-268.
7. R. Rodriguez, I. Gutierrez., Materials Science and Engineering A 361, 377-384(2003).
8. Nix WD, Gao H. J Mech Phys Solids 46,411-25 (1998)
9. J. G. Swadener, E. P George, G. M Pharr, J. Mech. Phys. Solids 50, 681-694 (2002)
10. J. B. Pethica, R. Hutchings, And W.C. Oliver, Phil. Mag. A 48, 593 (1983)
11. G. M. Pharr, W. C. Oliver, and F. R. Brotzen, J. Mater. Res. 7, 613 (1992)
12. M. F. Doerner and W. D. Nix, J. Mater. Res. 1, 601 (1986)
13. Nix W.D, Gao, J Mech Phys Solids 46, 411-25 (1998).
14. G.J. Thomas, R. W. Siegel, and J. A Eastman, Scripta Metall. Mater. 24, 201 (1990)
15. T. Y. Tsui, W. C. Oliver, and G. M Pharr, in Indenter geometry effects on the measurement of mechanical properties by nanoindentation with sharp indenters (Mat. Res. Soc. Symp. Proc, 439, 1997) pp. 147-152.
16. T. Y. Tsui, Joost Vlassak, W. D. Nix, J. Mater. Res., 14, 2196 (1999)
17. D. E. Kramer, A.A. Volinsky, N. R. Moody, and W. W. Gerberich, J. Mater. Res., 16, 3150 (2001).
18. G. Dehm, B.J. Inkson, T. J. Balk, T. Wagner, and E. Arzt, in Influence of film/substrate interface structure on plasticity in metal thin films, (Mat. Res. Symp. Proc., 673, 2001) pp. 2.6.1-2.6.11
19. J. L. Hay, G. M. Pharr, Instrumented Indentation Testing, ASM Hand book, vol. 8.
20. Oliver WC, Pharr GM. J Mater Res. 7, 1564 (1992).
21. Ranjana Sana, William D. Nix, Acta Materialia 50, 23-38 (1992).