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Volumn 989, Issue , 2007, Pages 511-516

Elastic properties of several silicon nitride films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ELASTICITY; INTERNAL FRICTION; LOW PRESSURE CHEMICAL VAPOR DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON NITRIDE;

EID: 41549165786     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0989-a22-01     Document Type: Conference Paper
Times cited : (17)

References (15)
  • 7
    • 0029216795 scopus 로고    scopus 로고
    • B. E. White, Jr., R. O. Pohl in Thin Films: Stresses and Mechanical roperties V, edited by S. P. Baker, C. A. Ross, P. H. Townsend, C. A. Volkert, and P. Borgesen, (Mat. Res. Soc. Symp. Proc. 356, Pittsburgh, PA, 1995) pp. 567-573.
    • B. E. White, Jr., R. O. Pohl in Thin Films: Stresses and Mechanical roperties V, edited by S. P. Baker, C. A. Ross, P. H. Townsend, C. A. Volkert, and P. Borgesen, (Mat. Res. Soc. Symp. Proc. 356, Pittsburgh, PA, 1995) pp. 567-573.
  • 13
    • 41549140989 scopus 로고
    • Ph.D. thesis, Cornell University
    • J. E. Van Cleve, Ph.D. thesis, Cornell University, 1991.
    • (1991)
    • Van Cleve, J.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.