-
1
-
-
0001473741
-
AlGaN/GaN HEMTs - an overview of device operation and applications
-
June
-
U.K. Mishra, P. Parikh and Y. Wu, "AlGaN/GaN HEMTs - an overview of device operation and applications," Proceedings of the IEEE, volume 90, issue 6, June 2002, pp. 1022-1031.
-
(2002)
Proceedings of the IEEE
, vol.90
, Issue.6
, pp. 1022-1031
-
-
Mishra, U.K.1
Parikh, P.2
Wu, Y.3
-
2
-
-
0037954432
-
An assesment of wide bandgap semiconductors for power devices
-
May
-
J.L. Hudgins, G.S. Simin, E. Santi and M.A. Kahn, "An assesment of wide bandgap semiconductors for power devices," IEEE Transactions on Power Electronics, volume 18, Issue 3, May 2003, pp. 907-914.
-
(2003)
IEEE Transactions on Power Electronics
, vol.18
, Issue.3
, pp. 907-914
-
-
Hudgins, J.L.1
Simin, G.S.2
Santi, E.3
Kahn, M.A.4
-
3
-
-
0035278799
-
Trapping effects and microwave power performance in AlGaN/GaN HEMTs
-
March
-
S.C. Binari, K. Ikossi, J.A. Roussos, W. Kruppa, Doewon Park, H.B. Dietrich, D.D. Koleske, A.E. Wickenden and R.L. Henry, "Trapping effects and microwave power performance in AlGaN/GaN HEMTs," IEEE Transactions on Electron Devices, volume 48, Issue 3, March 2001, pp. 465-471.
-
(2001)
IEEE Transactions on Electron Devices
, vol.48
, Issue.3
, pp. 465-471
-
-
Binari, S.C.1
Ikossi, K.2
Roussos, J.A.3
Kruppa, W.4
Park, D.5
Dietrich, H.B.6
Koleske, D.D.7
Wickenden, A.E.8
Henry, R.L.9
-
4
-
-
21644476044
-
Simulation of gate lag and current collapse in GaN heterojunction field effect transistors
-
N. Braga, R. Mickevicius, M. Shur, R. Gaska, M. Asif Khan and G. Simin, "Simulation of gate lag and current collapse in GaN heterojunction field effect transistors," IEEE Compound Semiconductor Integrated Circuit Symposium, 2004, pp. 287-290.
-
(2004)
IEEE Compound Semiconductor Integrated Circuit Symposium
, pp. 287-290
-
-
Braga, N.1
Mickevicius, R.2
Shur, M.3
Gaska, R.4
Asif Khan, M.5
Simin, G.6
-
5
-
-
0032669293
-
Trap effects studies in GaN MESFETs by pulsed measurements
-
5 Aug
-
S. Trassaert, B. Boudart, C. Gasquire, D. Theron, Y. Crosnier, F. Huet and M.A. Poisson, "Trap effects studies in GaN MESFETs by pulsed measurements," Electronic Letters, volume 35, Issue 16, 5 Aug. 1999, pp. 1386-1388.
-
(1999)
Electronic Letters
, vol.35
, Issue.16
, pp. 1386-1388
-
-
Trassaert, S.1
Boudart, B.2
Gasquire, C.3
Theron, D.4
Crosnier, Y.5
Huet, F.6
Poisson, M.A.7
-
6
-
-
33749265887
-
Analysis of DC-RF Dispersion in AlGaN/GaN HFET's Using Pulsed I-V and Time-Domain Waveform Measurements
-
P. McGovem et.al., "Analysis of DC-RF Dispersion in AlGaN/GaN HFET's Using Pulsed I-V and Time-Domain Waveform Measurements," Microwave Symposium Digest, 2005 IEEE MTT-S Int., 12-17 June, pp. 503-506.
-
Microwave Symposium Digest, 2005 IEEE MTT-S Int., 12-17 June
, pp. 503-506
-
-
McGovem, P.1
-
7
-
-
84937653776
-
A vector corrected high power on-wafer measurement system with a frequency range for higher harmonics up to 40GHz
-
th European Microwave Conference, 1994, pp. 1367-1372.
-
(1994)
th European Microwave Conference
, pp. 1367-1372
-
-
Tasker, P.J.1
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