Combinatorial measurements of Hall effect and resistivity in oxide films

Review of Scientific Instruments

Volumn 79, Issue 3, 2008, Pages

  Clayhold, J A ^a   Kerns, B M ^a   Schroer, M D ^a   Rench, D W ^a   Logvenov, G ^b   Bollinger, A T ^b   Bozovic, I ^b  

^a MIAMI UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; ELECTRIC CONDUCTIVITY; FILM GROWTH; HALL EFFECT; MOLECULAR BEAM EPITAXY; THIN FILMS;

COMBINATORIAL LIBRARIES; CONDUCTIVE OXIDES;

OXIDE FILMS;

EID: 41549103341     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2901622     Document Type: Article

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