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Volumn 352, Issue , 2000, Pages 1-8

COMBE: A powerful new tool for materials science

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; FERROMAGNETIC MATERIALS; FILM PREPARATION; HIGH TEMPERATURE SUPERCONDUCTORS; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC FILMS; MATERIALS SCIENCE; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUPERCONDUCTING FILMS; SYNTHESIS (CHEMICAL); THERMODYNAMICS;

EID: 0343774008     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (11)

References (13)
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    • X.D. Xiang et al., Science 268, 1738 (1995).
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  • 2
    • 0029388980 scopus 로고
    • G. Briceno et al., Science 270, 273 (1995).
    • (1995) Science , vol.270 , pp. 273
    • Briceno, G.1
  • 3
    • 0031259576 scopus 로고    scopus 로고
    • E. Danielson, et al., Nature 389, 944 (1997).
    • (1997) Nature , vol.389 , pp. 944
    • Danielson, E.1
  • 4
    • 5244310296 scopus 로고    scopus 로고
    • E. Danielson, et al., Science 279, 837 (1998).
    • (1998) Science , vol.279 , pp. 837
    • Danielson, E.1
  • 5
    • 0002962155 scopus 로고
    • I. Božović et al., Physica C 235-240, 178 (1994).
    • (1994) Physica C , vol.235-240 , pp. 178
    • Božović, I.1
  • 9
    • 4243585094 scopus 로고    scopus 로고
    • Reflection High-Energy Electron Diffraction as a Tool for Real Time Characterization of Growth of Complex Oxides
    • Ch. 3 A. Kraus and O. Auciello, eds. John Wiley and Sons, New York, in press
    • I. Božović, et al., "Reflection High-Energy Electron Diffraction as a Tool for Real Time Characterization of Growth of Complex Oxides", Ch. 3 in "Characterization of Thin Film Growth Processes via In Situ Techniques", A. Kraus and O. Auciello, eds. (John Wiley and Sons, New York, 1999), in press.
    • (1999) Characterization of Thin Film Growth Processes Via in Situ Techniques
    • Božović, I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.