Epitaxial strain and superconductivity in La2-xSrxCuO4 thin films

Physical Review Letters

Volumn 89, Issue 10, 2002, Pages 1070011-1070014

  Bozovic, I ^a,b   Logvenov, G ^a,b   Belca, I ^a,b   Narimbetov, B ^a,b   Sveklo, I ^a,b  

^a UNIVERSITY OF BREMEN   (Germany)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DOPING (ADDITIVES); FILM GROWTH; LANTHANUM COMPOUNDS; MOLECULAR BEAM EPITAXY; OXIDATION; OXYGEN; PARTIAL PRESSURE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; STRAIN; THIN FILMS; TRANSPORT PROPERTIES; X RAY DIFFRACTION ANALYSIS;

TENSILE EPITAXIAL STRAIN;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0037009584     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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