Analyzing the influence of alloying elements and impurities on the localized reactivity of titanium grade-7 by scanning electrochemical microscopy

Analytical Chemistry

Volumn 80, Issue 5, 2008, Pages 1437-1447

  Zhu, Renkang ^a   Qin, Ziqiang ^a   Noël, James J ^a   Shoesmith, David W ^a   Ding, Zhifeng ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING ELEMENTS; ENERGY DISPERSIVE X RAY ANALYSIS; FINITE ELEMENT METHOD; GRAIN BOUNDARIES; IMPURITIES; SCANNING ELECTRON MICROSCOPY;

ACTIVE LOCATIONS; CATHODIC BIAS; PROBE APPROACH CURVES (PAC); SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);

TITANIUM ALLOYS;

ALLOY; IRON; OXIDE; PALLADIUM; SODIUM CHLORIDE; TITANIUM; TITANIUM DIOXIDE;

AERATION; ANALYTIC METHOD; ARTICLE; COMPUTER PROGRAM; CURVE FITTING; ELECTRIC CONDUCTIVITY; FINITE ELEMENT ANALYSIS; IMAGE ANALYSIS; MATHEMATICAL MODEL; QUANTITATIVE ANALYSIS; SCANNING ELECTROCHEMICAL MICROSCOPY; SIMULATION; SURFACE PROPERTY; VARIANCE; X RAY ANALYSIS;

EID: 41149161667     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac701796u     Document Type: Article

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