Enhancing image quality of scanning electrochemical microscopy by improved probe fabrication and displacement

Canadian Journal of Chemistry

Volumn 83, Issue 10, 2005, Pages 1779-1791

  Zhu, Renkang ^a   Ding, Zhifeng ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Atomic force microscopy; Closed loop imaging; Microelectrode fabrication; Probe approach curve; Scanning electrochemical microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; CYCLIC VOLTAMMETRY; IMAGE QUALITY; MICROSTRUCTURE; REACTION KINETICS;

CLOSED-LOOP IMAGING; MICROELECTRODE FABRICATION; PROBE APPROACH CURVE; SCANNING ELECTROCHEMICAL MICROSCOPY;

IMAGE ENHANCEMENT;

GOLD; PLATINUM; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL REACTION; CHEMICAL STRUCTURE; COMPARATIVE STUDY; CURVE FITTING; CYCLIC POTENTIOMETRY; ELECTRON TRANSPORT; IMAGE PROCESSING; IMAGE QUALITY; IMAGING SYSTEM; KINETICS; MICROELECTRODE; OPTICAL RESOLUTION; SCANNING ELECTROCHEMICAL MICROSCOPY; SURFACE CHARGE; SURFACE PROPERTY; THERMOSTABILITY; VIDEORECORDING;

EID: 33644841266     PISSN: 00084042     EISSN: None     Source Type: Journal    
DOI: 10.1139/v05-189     Document Type: Article

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