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Volumn 6884, Issue , 2008, Pages

Experimental study of electrical breakdown in MEMS devices with micrometer scale gaps

Author keywords

Aluminum; Argon; Breakdown voltage; Helium; Mean free path; MEMS; Nitrogen; Paschen curve; Planar interdigitated electrodes

Indexed keywords

ALUMINUM; MEMS; MICROMETERS; NITROGEN;

EID: 41149149120     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.763195     Document Type: Conference Paper
Times cited : (17)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.