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Volumn 53, Issue 7, 2007, Pages 279-282
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Spectroscopical analysis of luminescent silicon rich oxide films
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Author keywords
EFTEM; Photoluminescence; Raman; Silicon clusters; Silicon rich oxide; XPS
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Indexed keywords
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EID: 41149128687
PISSN: 0035001X
EISSN: None
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (14)
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References (17)
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