Analysis of the defect activation in CZ-silicon by temperature-dependent bias-induced degradation of solar cells

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn A, Issue , 2003, Pages 919-922

  Glunz, S W ^a   Schaffer E ^a   Rein, S ^a   Bothe, K ^b   Schmidt, J ^b  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION RATE; DEFECT ACTIVATION; DEFECT ENERGY LEVEL; METASTABLE DEFECT;

ACTIVATION ENERGY; CARRIER CONCENTRATION; DEFECTS; DEGRADATION; FERMI LEVEL; ILLUMINATING ENGINEERING; SOLAR CELLS; THERMAL EFFECTS;

SILICON;

EID: 6344240819     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. S. Rein, T. Rehrl, W. Warta, S. W. Glunz, and G. Willeke, "Electrical and thermal properties of the metastable defect in boron-doped Czochralski silicon (Cz-Si)", Proc. 17th European Photovoltaic Solar Energy Conference, Munich, Germany (2001) pp. 1555-1560.
2. H. Hashigami, Y. Itakura, A. Takaki, S. Rein, S. W. Glunz, and T. Saitoh, "Impact of carrier injection level on light-induced degradation of Cz-Si solar cell performance", Proc. 17th European Photovoltaic Solar Energy Conference, Munich, Germany (2001) pp. 1483-1486.
3. J. Schmidt, A. G. Aberle, and R. Hezel, "Investigation of carrier lifetime instabilities in Cz-grown silicon", Proc. 26th IEEE Photovoltaic Specialists Conference, Anaheim, California, USA (1997) pp. 13-18.
4. J. Schmidt, K. Bothe, and R. Hezel, "Formation and annihilation of the metastable defect in boron-doped Czochralski silicon", Proc. 29th IEEE Photovoltaics Specialists Conference, New Orleans, Louisiana, USA (2002) pp. 178-181.
5. S. Rein and S. W. Glunz, "Electronic properties of the metastable defect in boron-doped Czochralski silicon: Unambiguous determination by advanced lifetime spectroscopy", Appl. Phys. Lett. 82 1054-1056 (2003).