Retention of data in heat-damaged SIM cards and potential recovery methods

Forensic Science International

Volumn 177, Issue 1, 2008, Pages 42-46

  Jones, B J ^a,b   Kenyon, A J ^b  

^a BRUNEL UNIVERSITY   (United Kingdom)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

Data recovery; Fire; Mobile phone; Scanning probe microscopy; SIM card

Indexed keywords

ARTICLE; FIRE; HEATING; MICROCHIP ANALYSIS; MOBILE PHONE; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY; STORAGE; TEMPERATURE SENSITIVITY;

EID: 41049101669     PISSN: 03790738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.forsciint.2007.10.007     Document Type: Article

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