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Volumn 45, Issue 7-8, 2005, Pages 1094-1108

Reliability of erasing operation in NOR-Flash memories

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC FIELD EFFECTS; HOLE TRAPS; LEAKAGE CURRENTS; PROCESS CONTROL; STRESS ANALYSIS; THRESHOLD VOLTAGE; VOLTAGE DISTRIBUTION MEASUREMENT;

EID: 20344367995     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.12.006     Document Type: Article
Times cited : (11)

References (39)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.