Characterization of catastrophic optical damage in Al-free InGaAs/InGaP 0.98 μm high-power lasers

Applied Physics Letters

Volumn 73, Issue 18, 1998, Pages 2567-2569

  Park, K H ^a   Lee, J K ^a   Jang, D H ^a   Cho, H S ^a   Park, C S ^a   Pyun, K E ^a   Jeong, J Y ^b   Nahm, S ^b   Jeong, J ^b  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^b Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000851368     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122557     Document Type: Article

References (10)

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