EBIC and TEM analysis of catastrophic optical damage in high-power GaAlAs/GaInAs lasers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3004, Issue , 1997, Pages 145-150

  Mallard, Robert E ^a   Clayton, Rick D ^a  

^a NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRON BEAMS; FABRICATION; FAILURE ANALYSIS; HETEROJUNCTIONS; SEMICONDUCTING GALLIUM COMPOUNDS; TESTING; TRANSMISSION ELECTRON MICROSCOPY;

CATASTROPHIC OPTICAL DAMAGE; ELECTRON BEAM INDUCED CURRENTS;

SEMICONDUCTOR LASERS;

EID: 0031383481     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)