Analysis of thermal images from diode lasers: Temperature profiling and reliability screening

Applied Physics Letters

Volumn 86, Issue 20, 2005, Pages 1-3

  Kozlowska, Anna ^a   Latoszek, Mateusz ^a   Tomm, Jens W ^b   Weik, Fritz ^b   Elsaesser, Thomas ^b   Zbroszczyk, Mariusz ^a   Bugajski, MacIej ^a   Spellenberg, B ^c   Bassler, M ^c  

^a ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^b MAX BORN INSTITUT   (Germany)

^c Thermosensorik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HEATING; IMAGE ANALYSIS; INFRARED RADIATION; RAMAN SPECTROSCOPY; RESONATORS; SEMICONDUCTOR QUANTUM WELLS; SUBSTRATES; TEMPERATURE DISTRIBUTION; THERMODYNAMIC PROPERTIES; THERMOGRAPHY (IMAGING);

FACET HEATING; MICRO-RAMAN SPECTROSCOPY; TEMPERATURE PROFILING; THERMAL IMAGES;

SEMICONDUCTOR LASERS;

EID: 20844450920     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1928319     Document Type: Article

References (13)

1. http://www.alfalight.com/
2. S. Todoroki, M. Sawai, and K. Aiki, J. Appl. Phys. 58, 1124 (1985).
3. H. Brugger and P. W. Epperlein, Appl. Phys. Lett. 56, 1049 (1990).
4. P. W. Epperlein, G. L. Bona, and P. Roentgen, Appl. Phys. Lett. 60, 680 (1992).
5. S. Huth, O. Breitenstein, U. Lambert, and A. Huber, Mater. Sci. Semicond. Process. 4, 39 (2001).
6. D. Shvydka, J. P. Rakotoniaina, and O. Breitenstein, Appl. Phys. Lett. 84, 729 (2004).
7. G. C. Albright, J. A. Stump, J. D. McDonald, and H. Kaplan, Proc. SPIE 3700, 245 (1999).
8. G. C. Albright, J. A. Stump, C. P. Li, and H. Kaplan, Proc. SPIE 4360, 103 (2001).
9. A. Kozlowska and J. W. Tomm (unpublished).
10. http://www.cfdrc.com
11. W. Nakwaski, J. Appl. Phys. 64, 159 (1988).
12. We should mention that both FEM and experiment involve several systematic error sources affecting the absolute temperature values. Thus, our positive statement holds mainly for the agreement of the shapes of the temperature distributions.
13. F. Rinner, J. Rogg, H. Konstanzer, M. Mikulla, G. Weimann, J. W. Tomm, E. Thamm, and R. Poprawe, J. Appl. Phys. 93, 1848 (2003).