Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-x Gex films

Journal of Applied Physics

Volumn 103, Issue 5, 2008, Pages

  Ko, V ^a   Teo, K L ^a,b   Liew, T ^a,b   Chong, T C ^a,b   Liu, T ^a   Wee, A T S ^a   Du, A Y ^c   Stoffel, M ^d   Schmidt, O G ^d,e  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b DATA STORAGE INSTITUTE   (Singapore)

^c INSTITUTE OF MICROELECTRONICS   (Singapore)

^d MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^e IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ION IMPLANTATION; MAGNETIC FILMS; MAGNETIC PROPERTIES; MANGANESE; TRANSMISSION ELECTRON MICROSCOPY;

FERROMAGNETIC ORDERING; X-RAY ABSORPTION FINE STRUCTURE;

FERROMAGNETIC MATERIALS;

EID: 40849113331     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2842404     Document Type: Article

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