1/f Electrical noise in planar resistors: The joint effect of a backgating noise and an instrumental disturbance

IEEE Transactions on Instrumentation and Measurement

Volumn 57, Issue 3, 2008, Pages 509-517

  Izpura, José Ignacio ^a  

^a UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

T C noise; 1 f electrical noise; Backgating effect; Distributed bias; Excess noise; Noise measurement; Parasitic FET; RC cell

Indexed keywords

BIAS VOLTAGE; CAPACITORS; SHEET RESISTANCE; THERMAL NOISE;

BACKGATING EFFECT; DISTRIBUTED BIAS; HOOGE'S FORMULA;

RESISTORS;

EID: 40549112018     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.911642     Document Type: Article

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