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Surface band-bending assessment by photocurrent techniques. Application to III-V semiconductors
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J. I. Izpura, Thermal fluctuations of electrostatic energy in surfaces as 1/f noise sources, Submitted in Feb. 2004 (unpublished). Ref [7] is a simplified version of this first work together with experimental data added in proof.
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J. I. Izpura, "Thermal fluctuations of electrostatic energy in surfaces as 1/f noise sources," Submitted in Feb. 2004 (unpublished). Ref [7] is a simplified version of this first work together with experimental data added in proof.
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36249013142
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1/f electrical noise in planar resistors: The joint effect of a backgating noise and a disturbance due to its measurement
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J.I. Izpura, "1/f electrical noise in planar resistors: the joint effect of a backgating noise and a disturbance due to its measurement," Accepted for publication in IEEE Trans. Instrum. Meas. (2006)
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Excess noise in AlGaAs/GaAs Heterojunction bipolar transistors and associated TLM test structures
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1/f Noise in InGaAs/GaAs Linear Graded Buffer Layers
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Backgate-Induced characteristics of Ion-Implanted GaAs MESFET's
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Noise tunability of planar junction diodes: Theory, experiment and additional support by SPICE
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Universidad Politécnica de Madrid, ISBN: 84-689-9590-8
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Foundations of electrical noise in solid-state sensors
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Submitted for publication
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J. I. Izpura, Method to reduce excess noise in electronic devices and monolithic integrated circuits, Patent number P200502744, Universidad Politecnica de Madrid, (2005).
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J. I. Izpura, "Method to reduce excess noise in electronic devices and monolithic integrated circuits, Patent number P200502744, Universidad Politecnica de Madrid, (2005).
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Measurement of 1/f noise and its application in materials science
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1/f noise is no surface effect
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1/f noise in MOS devices, mobility or number fluctuations?
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1/f noise in vacuum devices
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To be submitted
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J. I. Izpura, "1/f noise in vacuum devices," (To be submitted) (2007)
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Izpura, J.I.1
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