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Volumn 6590, Issue , 2007, Pages

The electrical origin of the 1/f electrical noise in solid-state devices and integrated circuits

Author keywords

1 f electrical noise; KT C noise; Low frequency noise; Parasitic FET; Resistance; Resistor

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; RESISTORS; SEMICONDUCTOR JUNCTIONS; SPECTRUM ANALYSIS; THERMAL NOISE;

EID: 36248973062     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.721175     Document Type: Conference Paper
Times cited : (2)

References (25)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.