Measurement of 1 /f noise and its application in materials science

Current Opinion in Solid State and Materials Science

Volumn 6, Issue 1, 2002, Pages 67-85

  Raychaudhuri, A K ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

NOISE;

EID: 0036481366     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(02)00025-6     Document Type: Article

References (116)

1. Flicker noise in electronic devices
2. Low frequency fluctuations in solids: 1 /f noise
3. 1/f noise and other slow, non-exponential kinetics in condensed matter
4. Electrical noise as a measure of quality and reliability in electronics devices
5. Temperature and frequency dependence of flicker noise in degenerately doped Si singel crystals
6. Relation between variance and sample duration of 1 /f noise
7. 1 /f noise sources
8. 1 /f noise is no surface effect
9. Flicker (1/f) noise: Equilibrium temperature and resistance fluctuations
10. Direct link between 1/f noise and defects in metal films
11. Influence of the damage caused by uniaxial compression on the 1 /f noise in GaAs Soviet physics
12. Excess 1 /f noise in metals
13. Self-organized criticality: An explanation of 1 /f noise
14. Diffusion noise in fractal networks and percolation clusters
15. Sensitivity of the conductance fluctuation of a disordered metal to the motion of a single atom: Implications for 1 /f noise
16. Quantitative local interference model for 1 /f noise in metal films
17. Semiconductor impurity analysis from low frequency noise analysis
18. Nature of the bulk 1 /f noise in GaAs and Si
19. Universal 1 /f noise form dissipative SOC model
20. Statistical characterization of Barkhausen noise
21. Disordered electronic systems
22. Defect motion and low frequency noise in disordered metals
23. Noise in solid state microstructure; a new perspective on individual defects, interface states and low frequency 1 /f noise
24. AC method for measuring low-frequency resistance fluctuation spectra
25. A novel technique for measuring resistance fluctuations independently of background noise
26. Noise probe for bias dependent current path rearrangements in disordered solids
27. Microscopic identification of the origin of generation-recombination noise in hydrogenated amorphous silicon with noise detected magnetic resonance
28. 1/f noise of metals: A case of extrinsic origin
29. Temperature dependence of noise processes in metals
30. 1/f noise and grain boundary diffusion in aluminium and aluminium alloys
31. Irradiation induced defects in thin aluminium films studied by 1 /f noise
32. Weak localization, universal fluctuations and 1 /f noise in Ag
33. Low frequency hydrogen-configuration fluctuations in Niobium
34. Clusterization of light interstitial impurities and 1 /f noise in metals
35. Application of the current noise technique to the investigation on dislocation in metals during plastic deformation
36. 1 /f noise in mono and polycrystalline aluminium
37. Effect of starin on the 1 /f noise in metal films
38. Stress induced electrical noise in stainless steel
39. Mechanical relaxation and 1 /f noise in Bi, Nb and Fe films
40. Correlation between 1 /f noise and grain boundaries in thin gold film
41. 1/f noise and electromigration in aluminium films: The effect of the film microstructure and texture
42. Grain size dependence of noise in Al-Cu thin film interconnects
43. Dependence of electromigration on geometrical and structural characterization of Al-based resistors
44. Prediction of electromigration failure in W/Al-Cu multilayer metallization by 1 /f noise measurements
45. Electromigration noise measurements using a novel AC/DC wafer level noise measurements
46. Electromigration in isolated aluminium vias probed by resistance change and 1 /f noise
47. Hall-effect, anisotrophy and temperature dependence of 1 /f noise in silicon-on-sapphire
48. Annealing of ion implanted resistors reduces 1 /f noise
49. Temperature dependence of 1 /f noise in silicon
50. 1 /f noise in ion implanted resistors between 77 K and 300 K
51. Volume and temperature dependence of the 1 /f noise parameters in Si
52. Effect of nonmonotonic dependence of the 1 /f noise on the intensity of illumination of Si and a model for the bulk 1 /f noise in Si
53. Kinetics of the slow decay of the photoconductivity of GaAs and model of 1 /f nose in semiconductors
54. 1 /f noise in GaAs evidence of new scale invariance
55. 1-xAs heterostructures
56. 1 /f noise at room temperature in n-type GaAs grown by molecular beam epitaxy
57. Temperature dependence of 1 /f noise in epitaxial n-type GaAs
58. Noise of the 1 /f type and electrical and photoelectrical properties of GaAs bombarded with high energy ions
59. Intrinsic and extrinsic 1 /f noise in proton irradiated n-GaAs epitaxial layers
60. +-GaAs resistors
61. Noise spectroscopy of local levels in semiconductors
62. Generation-recombination noise analysis in heavily doped p-type GaAs transmission line model
63. 0.7As quantum-well sample using noise spectroscopy
64. 1 /f noise in delta-doped GaAs analyzed in terms of mobility fluctuations
65. Conductance fluctuations near Anderson transition
66. Universal conductance fluctuations in three dimensional metallic single crystals of Si
67. Effect of two-level systems on the spectral density of universal conductance fluctuation in doped Si
68. Low frequency noise performance in GaN p-n junction photodetectors
69. Low frequency noise in n-GaN with high electron mobility
70. Bulk noise processes and their correlation to structural imperfections in Mg-doped p-type GaN grown on sapphire
71. Nature of 1 /f noise in 6 H-SiC
72. Electron cyclotron resonance plasma etching of n-SiC and evaluation of Ni/n-SiC contacts by current noise measurements
73. Study of 1 /f noise in InP grown by CBE
74. The temperature dependence of 1 /f noise in InP
75. 1 /f noise in HgCdTe
76. Doping dependence of low frequency noise in polycrystalline SiG film resistors
77. Flicker noise in degenerately doped Si single crystals near the metal-insulator transition
78. Noise characteristics of radio frequency sputtered amorphous silicon carbide films
79. Noise characterization of sputtered amorphous carbon films
80. Conductance noise power fluctuations in hydrogenated amorphous silicon
81. Random telegraph-switching noise in coplanar current measurements of amorphous silicon
82. Dynamical percolation model of conductance fluctuation in hydrogenated amorphous silicon
83. Weakly non-Gaussian processes in a-Si:H conductance noise
84. Temperature and doping dependence of non-Gaussian 1 /f noise and noise statistics in a-Si
85. Non-equilibrium 1 /f noise in amorphous Si
86. 1 /f noise power measurements of copper oxide superconductors in the normal and superconducting state
87. Thermal fluctuations and 1 /f noise in oriented and unoriented YBaCuO films
88. The noise characteristics of YBCO films with strong pinning
89. Local magnetic order in manganites thin films studied by 1 /f noise measurements
90. 3 films
91. c superconductor
92. Giant 1 /f noise in perovskite manganites: Evidence of the percolation threshold
93. Low frequency noise in the normal state of thin film high temperature superconductor
94. Sources of flicker noise and the technology of superconducting microstripes based on Yttrium Barium Cuprate films
95. δ
96. Electric field induced migration of oxygen ions in epitaxial metallic oxide films: Non-Debye relaxation and 1/f noise
97. c cuprate films
98. Electrical noise in YBaCuO superconducting thin films with differing axes of orientation
99. 7 superconducting bicrystal grain boundary junction
100. Mesoscopic thermodynamics of an inhomogeneous colossal MR phase
101. 3
102. 3
103. 3
104. 3: Effect of magnetic fields
105. Physical properties of macroscopically inhomogeneous medium
106. 1 /f noise through the metal-insulator transition in percolating carbons
107. Two component model for the resistivity and noise of tunnelling metal-insulator composites
108. Electrical conducting fluctuators near the percolation threshold
109. 1 /f noise in non-linear inhomogeneous system