1/f Noise enhancement in GaAs

AIP Conference Proceedings

Volumn 780, Issue , 2005, Pages 113-116

  Izpura, J I ^a   Malo, J ^a  

^a UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

1 f noise; Ssurface charge diffusion; Surface charge fluctuations

Indexed keywords

EID: 33749490672     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2036711     Document Type: Conference Paper

References (7)

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3. Choi, K.J., and Lee, J.L., IEEE Trans. Electron Devices 48, 190-195 (2001).
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5. Izpura, J.I., (unpublished) (2004).
6. Izpura, J.I., Semicond. Sci. Technol. 16, 243-249 (2001)
7. Izpura, J.I., Submitted to IEEE Electron Device Lett. (2005).