Eigen-System Analysis of X-ray Diffraction Profile Deconvolution Methods Explains Ill-Conditioning

Journal of Applied Crystallography

Volumn 31, Issue 3, 1998, Pages 453-460

  Armstrong, N ^a   Kalceff, W ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001027927     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897019638     Document Type: Article

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