SCOPUS 정보 검색 플랫폼

Volumn 103, Issue 4, 2008, Pages

The influence of Schottky contact metals on the strain of AlGaN barrier layers

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRIC CONTACTS; HETEROJUNCTIONS; POLARIZATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING ALUMINUM COMPOUNDS;

BARRIER LAYERS; CAPACITANCE VOLTAGE CURVES; SCHOTTKY CONTACTS;

METALS;

EID: 40149107879 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2841328 Document Type: Article

Times cited : (26)

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