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Volumn 66, Issue SUPPL. 1, 1998, Pages
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Ultra-high-vacuummagnetic forcemicroscopy of the domain structure of ultra-thin Co films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM;
ATOMIC FORCE;
CO FILMS;
DOMAIN STRUCTURE;
ELECTRON BEAM EVAPORATION;
FORCE GRADIENTS;
IN-PLANE MAGNETIZATION;
SCAN MODE;
SI SUBSTRATES;
TIP-SAMPLE DISTANCE;
TUNNELING MICROSCOPES;
ULTRA-HIGH;
ULTRA-THIN;
DOMAIN WALLS;
ELECTRON BEAMS;
MAGNETIC DOMAINS;
METALLIC FILMS;
MONOLAYERS;
PROBES;
ULTRAHIGH VACUUM;
COBALT;
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EID: 0344368881
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051328 Document Type: Article |
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Times cited : (5)
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References (7)
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