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Journal of Magnetism and Magnetic Materials

Volumn 156, Issue 1-3, 1996, Pages 94-98

Perspectives in element-specific magnetic domain imaging

(1) Schneider, C M a

a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; MAGNETIC PROPERTIES; MAGNETIC STORAGE; MAGNETISM; MAGNETOOPTICAL EFFECTS; MICROSTRUCTURE; OPTICAL KERR EFFECT; SOLIDS; SPECTROSCOPY; THIN FILMS; X RAY SPECTROSCOPY;

ELEMENT SPECIFIC ANALYSIS; HIGH ENERGY SPECTROSCOPY; MAGNETIC DICHROISM; MAGNETIC DOMAIN IMAGING; MAGNETIC MICROSTRUCTURES; MAGNETIC SENSITIVITY; SPATIALLY RESOLVED INVESTIGATION;

IMAGING TECHNIQUES;

EID: 0030124968 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/0304-8853(95)00802-0 Document Type: Article

Times cited : (6)

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