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Volumn 40, Issue 5, 2008, Pages 1006-1009

Demonstration of gating action in atomically controlled Si:P nanodots defined by scanning probe microscopy

Author keywords

Doping; Atom electronics; Molecular beam epitaxy; Quantum dots; Scanning probe microscopy; Silicon

Indexed keywords

ELECTRON RESONANCE; MOLECULAR BEAM EPITAXY; OHMIC CONTACTS; PHOSPHORUS; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS;

EID: 39649112391     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2007.08.057     Document Type: Article
Times cited : (5)

References (12)
  • 7
    • 37149010818 scopus 로고    scopus 로고
    • M. Füchsle, F.J. Rueß, T.C.G. Reusch, M. Mitic, M.Y. Simmons, J. Vac. Sci. B (2007), in press, doi:10.1116/1.2781512.
    • M. Füchsle, F.J. Rueß, T.C.G. Reusch, M. Mitic, M.Y. Simmons, J. Vac. Sci. B (2007), in press, doi:10.1116/1.2781512.
  • 8
    • 39649118666 scopus 로고    scopus 로고
    • F.J. Rueß, W. Pok, T.C.G. Reusch, G. Scappucci, M. Füchsle, M. Mitic, D.L. Thompson, M.Y. Simmons, J. Scann. Probe Microsc (2007), submitted for publication.
    • F.J. Rueß, W. Pok, T.C.G. Reusch, G. Scappucci, M. Füchsle, M. Mitic, D.L. Thompson, M.Y. Simmons, J. Scann. Probe Microsc (2007), submitted for publication.
  • 12
    • 39649084049 scopus 로고    scopus 로고
    • G. Scappucci, F. Ratto, D.L. Thompson, T.C.G. Reusch, W. Pok, F.J. Rueß, F. Rosei, M.Y. Simmons, Appl. Phys. Lett. (2007), submitted for publication.
    • G. Scappucci, F. Ratto, D.L. Thompson, T.C.G. Reusch, W. Pok, F.J. Rueß, F. Rosei, M.Y. Simmons, Appl. Phys. Lett. (2007), submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.