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Volumn , Issue , 2006, Pages 231-234

94-Gb/s 29-1 PRBS bit error detector IC in InP DHBT technology

Author keywords

Error detector; InP DHBT; PRBS

Indexed keywords

ELECTRIC CONDUCTIVITY; SEMICONDUCTOR MATERIALS;

EID: 39549122925     PISSN: 15508781     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CSICS.2006.319942     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 2
    • 39749179142 scopus 로고    scopus 로고
    • 9-1 PRBS Generator in InP HBT Technology, 2006 IEEE International Solid-State Circuits Conference, Dig. Tech. Papers, pp. 530-531, Feb. 2006.
    • 9-1 PRBS Generator in InP HBT Technology," 2006 IEEE International Solid-State Circuits Conference, Dig. Tech. Papers, pp. 530-531, Feb. 2006.
  • 4
    • 0027813979 scopus 로고
    • A 12.5 Gb/s Si Bipolar IC for PRBS Generation and Bit Error Detection Up to 25 Gb/s
    • Dec
    • M. Bussmann et al., "A 12.5 Gb/s Si Bipolar IC for PRBS Generation and Bit Error Detection Up to 25 Gb/s," IEEE J. Solid State Circuits, vol. 28, pp. 1303-1309, Dec. 1993.
    • (1993) IEEE J. Solid State Circuits , vol.28 , pp. 1303-1309
    • Bussmann, M.1
  • 5
    • 0031677849 scopus 로고    scopus 로고
    • A 10-Gb/s Silicon Bipolar IC for PRBS Testing
    • Jan
    • O. Kromat et al., "A 10-Gb/s Silicon Bipolar IC for PRBS Testing," IEEE J. Solid State Circuits, vol. 33, pp. 76-85, Jan. 1998.
    • (1998) IEEE J. Solid State Circuits , vol.33 , pp. 76-85
    • Kromat, O.1
  • 6
    • 0242696126 scopus 로고    scopus 로고
    • 45-Gb/s SiGe BiCMOS PRBS Generator and PRBS Checker
    • Sept
    • S. Kim et al., "45-Gb/s SiGe BiCMOS PRBS Generator and PRBS Checker," IEEE Custom Integrated Circuits Conference, pp. 313-316, Sept. 2003.
    • (2003) IEEE Custom Integrated Circuits Conference , pp. 313-316
    • Kim, S.1
  • 7
    • 3943092602 scopus 로고    scopus 로고
    • max Over 300 GHz in a New Manufacturaba Technology
    • Aug
    • max Over 300 GHz in a New Manufacturaba Technology," IEEE Electron Device Letters, vol. 25, pp. 520-522, Aug. 2004.
    • (2004) IEEE Electron Device Letters , vol.25 , pp. 520-522
    • He, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.