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Volumn 34, Issue 3-6, 2003, Pages 327-334

Bipolar quantum corrections in resolving individual dopants in 'atomistic' device simulation

Author keywords

Atomistic; Charge assignment; Density gradient; MOSFET

Indexed keywords

CARRIER MOBILITY; COMPUTER SIMULATION; DIFFUSION; ELECTRIC RESISTANCE; ELECTRON ENERGY LEVELS; MOSFET DEVICES; POISSON EQUATION; QUANTUM THEORY; RESISTORS; SEMICONDUCTOR DOPING;

EID: 3242675991     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2004.03.066     Document Type: Conference Paper
Times cited : (20)

References (11)
  • 7
    • 24444459722 scopus 로고    scopus 로고
    • Sano N., Matsuzawa K., Mukai M., Nakayama N. Electron Devices Meeting. 2000;IEDM Tech. Dig. 2000;275.
    • (2000) IEDM Tech. Dig. , pp. 275


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.