CAD tools for variation tolerance

Proceedings - Design Automation Conference

Volumn , Issue , 2005, Pages 766-

  Blaauw, David ^a   Chopra, Kaviraj ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Design Flows; Variability; Yield

Indexed keywords

COMPUTER AIDED DESIGN; LEAKAGE CURRENTS; STATISTICAL METHODS;

DESIGN FLOWS; VARIABILITY; YIELD;

CMOS INTEGRATED CIRCUITS;

EID: 27944511578     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1065579.1065782     Document Type: Conference Paper

References (7)

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