Performance of sub-micron gate length InAlP native oxide GaAs-channel MOSFETs

65th DRC Device Research Conference

Volumn , Issue , 2007, Pages 211-212

  Zhang, J ^a   Kosel, T H ^a   Hall, D C ^a   Fay, P ^a  

^a UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 39549090337     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2007.4373722     Document Type: Conference Paper

References (8)

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8. Y. Cao et al., Proc. Compound Semiconductor Integrated Circuit Symp., p. 43, 2006.