Nonvolatile memory characteristics influenced by the different crystallization of Ni-Si and Ni-N nanocrystals

Applied Physics Letters

Volumn 92, Issue 6, 2008, Pages

  Chen, Wei Ren ^a   Chang, Ting Chang ^b   Yeh, Jui Lung ^a   Chang, Chun Yen ^a   Chen, Shih Ching ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTALLIZATION; NANOCRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CHARGE STORAGE CAPACITY; CHEMICAL MATERIAL ANALYSIS; THERMAL ANNEALING;

NONVOLATILE STORAGE;

EID: 39349092204     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2841049     Document Type: Article

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