Reverse analysis in depth-sensing indentation for evaluation of the Young's modulus of thin films

Philosophical Magazine

Volumn 88, Issue 3, 2008, Pages 313-325

  Antunes, J M ^a   Fernandes, J V ^b   Sakharova, N A ^b   Menezes, L F ^b  

^a INSTITUTO POLITÉCNICO DE TOMAR   (Portugal)

^b UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH INDICATORS; ELASTIC MODULI; INDENTATION; THIN FILMS;

DEPTH-SENSING INDENTATION; REVERSE ANALYSIS;

COMPOSITE MATERIALS;

EID: 39149103357     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701832404     Document Type: Article

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