Fabrication of island-type microelectrode via AFM lithography for a highly sensitive Pt-ion detection system

Sensors and Actuators, B: Chemical

Volumn 129, Issue 2, 2008, Pages 734-740

  Choi, Inhee ^a   Kang, Sung Koo ^a   Lee, Jeongjin ^a   Kim, Younghun ^b   Yi, Jongheop ^a  

^a Seoul National University   (South Korea)

^b Kwangwoon University   (South Korea)

Author keywords

Atomic force microscopy (AFM); Imidazole; Lateral force microscopy (LFM); Lithography; Patterning; Pt ion detection

Indexed keywords

ATOMIC FORCE MICROSCOPY; FUNCTIONAL GROUPS; LITHOGRAPHY; METAL IONS; NANOPARTICLES; PLATINUM;

IMIDAZOLE; LATERAL FORCE MICROSCOPY (LFM); ORGANOSILANE; PT-ION DETECTION;

MICROELECTRODES;

EID: 38949193540     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2007.09.059     Document Type: Article

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