메뉴 건너뛰기




Volumn 92, Issue 4, 2008, Pages

Experimental analysis for the effect of dynamic capillarity on stress transformation in porous silicon

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARITY; DRYING; MICROCRACKS; RAMAN SPECTROSCOPY; STRESS ANALYSIS;

EID: 38849086860     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2838716     Document Type: Article
Times cited : (23)

References (20)
  • 1
    • 0031073870 scopus 로고    scopus 로고
    • MIENEF 0167-9317 10.1016/S0167-9317(96)00209-2.
    • G. Kaltsas and A. G. Nassiopoulos, Microelectron. Eng. MIENEF 0167-9317 10.1016/S0167-9317(96)00209-2 35, 397 (1997).
    • (1997) Microelectron. Eng. , vol.35 , pp. 397
    • Kaltsas, G.1    Nassiopoulos, A.G.2
  • 2
    • 0141775174 scopus 로고
    • APPLAB 0003-6951 10.1063/1.103561.
    • L. T. Canham, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.103561 57, 1046 (1990).
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 1046
    • Canham, L.T.1
  • 6
    • 79956054177 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.1465130, ();, Opt. Lasers Eng. OLENDN 0143-8166 43, 847 (2005);, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1837686 144, 1835 (1997);, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2162273 99, 024304 (2006).
    • H. S. Kim, E. C. Zouzounis, and Y. H. Xie, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1465130 80, 2287 (2002); Y. L. Kang, Y. Qiu, Z. K. Lei, and M. Hu, Opt. Lasers Eng. OLENDN 0143-8166 43, 847 (2005); T. Unagami, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1837686 144, 1835 (1997); P. G. Abramof, A. F. Beloto, A. Y. Ueta, and N. G. Ferreira, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2162273 99, 024304 (2006).
    • (2002) Appl. Phys. Lett. , vol.80 , pp. 2287
    • Kim, H.S.1    Zouzounis, E.C.2    Xie, Y.H.3    Kang, Y.L.4    Qiu, Y.5    Lei, Z.K.6    Hu, M.7    Unagami, T.8    Abramof, P.G.9    Beloto, A.F.10    Ueta, A.Y.11    Ferreira, N.G.12
  • 7
    • 0000244983 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.50.17162.
    • D. Bellet and G. Dolino, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.50.17162 50, 17162 (1994).
    • (1994) Phys. Rev. B , vol.50 , pp. 17162
    • Bellet, D.1    Dolino, G.2
  • 11
    • 0029233371 scopus 로고
    • THSFAP 0040-6090 10.1016/0040-6090(94)05638-T.
    • U. Grüning and A. Yelon, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(94)05638-T 255, 135 (1995).
    • (1995) Thin Solid Films , vol.255 , pp. 135
    • Grüning, U.1    Yelon, A.2
  • 12
    • 38849094174 scopus 로고
    • Raman Spectroscopy (McGraw-Hill, New York).
    • D. A. Long, Raman Spectroscopy (McGraw-Hill, New York, 1977).
    • (1977)
    • Long, D.A.1
  • 17
  • 19
    • 0035138126 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.63.033402.
    • E. Buks and M. L. Roukes, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.63.033402 63, 033402 (2001).
    • (2001) Phys. Rev. B , vol.63 , pp. 033402
    • Buks, E.1    Roukes, M.L.2
  • 20
    • 33646346885 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.96.166103.
    • K. B. Jinesh and J. W. M. Frenken, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.96.166103 96, 166103 (2006).
    • (2006) Phys. Rev. Lett. , vol.96 , pp. 166103
    • Jinesh, K.B.1    Frenken, J.W.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.